EMC test­ing / EMC lab­o­ra­tory

Appoint­ments at short notice

Favourable hourly rates

Shorter mea­sur­ing times

Faster to mar­ket with EMC test­ing dur­ing devel­op­ment

In HESCH’s own EMC lab­o­ra­tory, we offer you com­pre­hen­sive EMC tests accord­ing to cer­ti­fied spec­i­fi­ca­tions. We ana­lyze whether the EMC mea­sure­ments of your pro­to­type meet the require­ments. You will then receive a detailed test report on the elec­tro­mag­netic com­pat­i­bil­ity (EMC).

accel­er­ate mar­ket matu­rity

Before elec­tri­cal or elec­tronic sys­tems and devices are ready for the mar­ket, they must be tested for inter­fer­ing elec­tri­cal or elec­tro­mag­netic effects. Only after pass­ing an EMC test by an accred­ited lab­o­ra­tory, which can be time-con­sum­ing and cost-inten­sive, do they reach mar­ket matu­rity. If this process takes place dur­ing devel­op­ment, mar­ket readi­ness is achieved more quickly.

pre­vent delays

Early EMC tests of pro­to­types with regard to their immu­nity to inter­fer­ence and emit­ted inter­fer­ence can pre­vent unpleas­ant sur­prises dur­ing later com­pli­ance mea­sure­ments. This is a good rea­son to use an EMC test already in the devel­op­ment phase, because it pro­vides impor­tant find­ings for cir­cuit and soft­ware opti­miza­tion and can save a lot of time and money.

Take advan­tage of the ben­e­fits:

Have your DUT tested in our EMC lab­o­ra­tory dur­ing devel­op­ment before pre­sent­ing it to the accred­ited lab­o­ra­tory for final accep­tance.

We offer the fol­low­ing mea­sure­ment meth­ods:

Con­ducted mea­sure­ment meth­ods

Inter­fer­ence immu­nity

    • EN 61000-4-2: Immu­nity to Elec­tro­sta­tic Dis­charge (ESD)
    • EN 61000-4-4: Inter­fer­ence immu­nity against pulse groups (burst)
    • EN 61000-4-5: Inter­fer­ence resis­tance against surge volt­ages 1.2/50 µs (Surge)
    • EN 61000-4-6: Immu­nity to high-fre­quency inter­fer­ence volt­ages from 9 kHz – 240 MHz (HF)
    • EN 61000-4-11: Immu­nity to volt­age vari­a­tions and short inter­rup­tions in power sup­ply sys­tems

Radi­ated mea­sure­ment meth­ods

Inter­fer­ence emis­sion

    • EN 55016-2-1: Mea­sure­ment of con­ducted inter­fer­ence volt­age

The HESCH EMC Lab­o­ra­tory

In our EMC test lab­o­ra­tory, the elec­tro­mag­netic com­pat­i­bil­ity (EMC) of your elec­tronic device is tested. EMC describes the abil­ity of the equip­ment not to cause unwanted and unac­cept­able inter­fer­ence with other equip­ment or devices in the envi­ron­ment and to oper­ate sat­is­fac­to­rily itself.

The well-equipped lab­o­ra­tory car­ries out clas­si­fi­ca­tion mea­sure­ments based, among other things, on the basic EN 61000-6 stan­dards for indus­trial (2 + 4) and res­i­den­tial (1 + 3) envi­ron­ments. It is located in the Boschstr. 8, 31535 Neustadt am Rüben­berge (Hanover region)

Leis­tungs­daten unseres Labors
ESD: bis 16 kV Luftent­ladung
EMF*: bis 20 V/m
Burst: bis 8 kV
Surge: bis 4 kV
HF: bis 20 V
* in GTEM-Zelle
Prüflings­daten für Mes­sun­gen in der GTEM-Zelle
Gle­ich- und Wech­selspan­nung:
230 V AC, 1 × 16 A
Definiertes Testvol­u­men:
25 × 25 × 25 cm
Max­i­male Prüflings­größe:
60 × 60 × 37,5 cm
Tür: 60 × 60 cm
GTEM cell in the EMC laboratory of HESCH

What does GTEM cell mean?

The abbre­vi­a­tion GTEM stands for Giga­hertz Trans­verse Elec­tro-Mag­netic and refers to a com­pletely enclosed and exter­nally shielded mea­sur­ing cham­ber in a pyra­mid-like shape. The GTEM cell is used for radi­ated immunity/radiated emis­sion mea­sure­ments accord­ing to IEC 61000-4-20. A mea­sure­ment of the inter­fer­ence immu­nity or inter­fer­ence emis­sion takes con­sid­er­ably less time in a GTEM cell (30 min) than a mea­sure­ment in an ane­choic cham­ber (approx. 2 h) and is there­fore already used at HESCH dur­ing prod­uct devel­op­ment.
In GTEM cells, mea­sure­ments can be made from 0 Hz up to sev­eral GHz. Thus, the device under test is tested for com­pli­ance with the EMC lim­its in a wide fre­quency spec­trum. Exter­nal effects are excluded because the GTEM cell is com­pletely elec­tro­mag­net­i­cally decou­pled from the envi­ron­ment.


We are happy to sup­port you with our many years of expe­ri­ence in the devel­op­ment phase of your test spec­i­men.

We are your part­ner for fast EMC inspec­tions, mea­sure­ments and tests.

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Elec­tron­ics devel­op­ment

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