·   +49 5032 - 9535 0   ·   [email protected]  ·    Login
HESCH / Ser­vices / EMC test

EMC test­ing / EMC labo­ra­tory

Appoint­ments at short notice

Favoura­ble hourly rates

Shorter mea­su­ring times

Fas­ter to mar­ket with EMC test­ing during deve­lo­p­ment

In HESCH’s own EMC labo­ra­tory, we offer you com­pre­hen­sive EMC tests accor­ding to cer­ti­fied spe­ci­fi­ca­ti­ons. We ana­lyze whe­ther the EMC mea­su­re­ments of your pro­to­type meet the requi­re­ments. You will then receive a detailed test report on the elec­tro­ma­gne­tic com­pa­ti­bi­lity (EMC).

acce­le­rate mar­ket matu­rity

Before elec­tri­cal or elec­tro­nic sys­tems and devices are ready for the mar­ket, they must be tes­ted for inter­fe­ring elec­tri­cal or elec­tro­ma­gne­tic effects. Only after pas­sing an EMC test by an accre­di­ted labo­ra­tory, which can be time-con­sum­ing and cost-inten­sive, do they reach mar­ket matu­rity. If this pro­cess takes place during deve­lo­p­ment, mar­ket rea­di­ness is achie­ved more quickly.

pre­vent delays

Early EMC tests of pro­to­ty­pes with regard to their immu­nity to inter­fe­rence and emit­ted inter­fe­rence can pre­vent unp­lea­sant sur­pri­ses during later com­pli­ance mea­su­re­ments. This is a good reason to use an EMC test alre­ady in the deve­lo­p­ment phase, because it pro­vi­des important fin­dings for cir­cuit and soft­ware opti­miza­tion and can save a lot of time and money.

Take advan­tage of the bene­fits:

Have your DUT tes­ted in our EMC labo­ra­tory during deve­lo­p­ment before pre­sen­ting it to the accre­di­ted labo­ra­tory for final accep­tance.

Jetzt Ange­bot anfor­dern

We offer the fol­lo­wing mea­su­re­ment methods

Con­duc­ted mea­su­re­ment methods

Inter­fe­rence immu­nity

    • EN 61000-4-2: Immu­nity to Elec­tro­sta­tic Discharge (ESD)
    • EN 61000-4-4: Inter­fe­rence immu­nity against pulse groups (burst)
    • EN 61000-4-5: Inter­fe­rence resis­tance against surge vol­ta­ges 1.2/50 µs (Surge)
    • EN 61000-4-6: Immu­nity to high-fre­quency inter­fe­rence vol­ta­ges from 9 kHz – 240 MHz (HF)
    • EN 61000-4-11: Immu­nity to vol­tage varia­ti­ons and short inter­rup­ti­ons in power sup­ply sys­tems

Inter­fe­rence emis­sion

    • EN 55016-2-1: Mea­su­re­ment of con­duc­ted inter­fe­rence vol­tage

Radia­ted mea­su­re­ment methods

Inter­fe­rence emis­sion

    • EN 61000-4-20: Mea­su­re­ment of radia­ted emis­si­ons in trans­verse elec­tro­ma­gne­tic TEM wave­gui­des from 30 MHz to 1 GHz

Inter­fe­rence immu­nity

    • EN 61000-4-20: Mea­su­re­ment of radia­ted immu­nity in trans­verse elec­tro­ma­gne­tic TEM wave­guide from 80 MHz to 1 GHz
  • EMV Prüfung im EMV Labor von HESCH
  • EMV Labor von HESCH

The HESCH EMC Labo­ra­tory

In our EMC test labo­ra­tory, the elec­tro­ma­gne­tic com­pa­ti­bi­lity (EMC) of your elec­tro­nic device is tes­ted. EMC descri­bes the ability of the equip­ment not to cause unwan­ted and unac­cep­ta­ble inter­fe­rence with other equip­ment or devices in the envi­ron­ment and to ope­rate satis­fac­to­rily its­elf.

The well-equip­ped labo­ra­tory car­ries out clas­si­fi­ca­tion mea­su­re­ments based, among other things, on the basic EN 61000-6 stan­dards for indus­trial (2 + 4) and resi­den­tial (1 + 3) envi­ron­ments. It is loca­ted in the Bosch­str. 8, 31535 Neu­stadt am Rüben­berge (Hano­ver region)

Per­for­mance data from our labo­ra­tory
ESD: up to 16 kV air discharge
EMF*: up to 20 V/m
Burst: up to 8 kV
Surge: up to 4 kV
HF: up to 20 V
* in GTEM cell
DUT (device under test) data for mea­su­re­ments in the GTEM cell
Direct and alter­na­ting vol­tage:
230VAC, 1 × 16A
Defi­ned test volume:
25×25×25cm
Maxi­mum spe­ci­men size:
60×60×37.5cm
Door: 60 × 60 cm
GTEM cell in the EMC laboratory of HESCH

What does GTEM cell mean?

The abbre­via­tion GTEM stands for Giga­hertz Trans­verse Elec­tro-Magne­tic and refers to a com­ple­tely enc­lo­sed and extern­ally shiel­ded mea­su­ring cham­ber in a pyra­mid-like shape. The GTEM cell is used for radia­ted immunity/radiated emis­sion mea­su­re­ments accor­ding to IEC 61000-4-20. A mea­su­re­ment of the inter­fe­rence immu­nity or inter­fe­rence emis­sion takes con­sider­a­bly less time in a GTEM cell (30 min) than a mea­su­re­ment in an anechoic cham­ber (approx. 2 h) and is the­r­e­fore alre­ady used at HESCH during pro­duct deve­lo­p­ment.
In GTEM cells, mea­su­re­ments can be made from 0 Hz up to seve­ral GHz. Thus, the device under test is tes­ted for com­pli­ance with the EMC limits in a wide fre­quency spec­trum. Exter­nal effects are excluded because the GTEM cell is com­ple­tely elec­tro­ma­gne­ti­cally decou­pled from the envi­ron­ment.

 

We are happy to sup­port you with our many years of expe­ri­ence in the deve­lo­p­ment phase of your test spe­ci­men.

We are your part­ner for fast EMC inspec­tions, mea­su­re­ments and tests.

Request a quote

You are loo­king for a spe­cia­list in the field of
Elec­tro­nics deve­lo­p­ment
?

We are happy to help you!

preloader